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Optimized test case generation based on operational profiles with fault-proneness information
Takagi, T.; Beyazit, M. (Studies in Computational Intelligence, 2015)In this paper, a novel formal model called an OPFPI (operational profile with fault-proneness information) and a novel algorithm to generate optimized test cases from the OPFPI are proposed in order to effectively improve ... -
Optimized Test Case Generation Based on Operational Profiles with Fault-Proneness Information
Takagi, T.; Beyazit, M. (SPRINGER-VERLAG BERLIN, 2015)In this paper, a novel formal model called an OPFPI (operational profile with fault-proneness information) and a novel algorithm to generate optimized test cases from the OPFPI are proposed in order to effectively improve ...
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