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dc.contributor.authorBeyazit M.:: Tuglular T.:: Kaya D.O.
dc.date.accessioned2024-04-06T11:44:20Z
dc.date.available2024-04-06T11:44:20Z
dc.date.issued2023
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85147230304&doi=10.1109%2fACCESS.2023.3234186&partnerID=40&md5=f842f4327b3281476b21fc8057e730f9
dc.identifier.urihttps://dspace.yasar.edu.tr/handle/20.500.12742/19179
dc.titleIncremental Testing in Software Product Lines - An Event Based Approach
dc.typeArticle
dc.relation.journalIEEE Access
dc.identifier.doi10.1109/ACCESS.2023.3234186
dc.relation.volume11
dc.identifier.startpage2384
dc.identifier.endpage2395
dc.identifier.volume11


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